BS 12/30235353 DC
Original price was: $244.85.$122.00Current price is: $122.00.
BS ISO 16413. Evaluation of thickness, density and interface width of thin films by X-ray reflectometry. Instrumental requirements, alignment and positioning, data collection, data analysis and reporting
BSI Group , 01/30/2012
Pages: 34
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Original price was: $264.16.$132.00Current price is: $132.00.
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Original price was: $264.16.$132.00Current price is: $132.00.