IEC 60749-17 Ed. 2.0 b:2019
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Semiconductor devices – Mechanical and climatic test methods – Part 17: Neutron irradiation
International Electrotechnical Commission , 03/28/2019
Pages: 17
IEC 60749-17 is used to determine the susceptibility of semiconductor devices to degradation in the neutron environment. Applicable to integrated circuits and discrete semiconductor devices.
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