IEC 60749-29 Ed. 1.0 b:2003
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Semiconductor devices – Mechanical and climatic test methods – Part 29: Latch-up test
International Electrotechnical Commission , 11/04/2003
Pages: 41
Covers the I-test and the overvoltage latch-up testing of integrated circuits. The purpose of this test is to establish a method for determining integrated circuit latch-up characteristics and to define latch-up failure criteria. Latch-up characteristics are used in determining product reliability and minimizing “”No Trouble Found”” and “”Electrical Overstress”” failures due to latch-up.
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