IEC 60749-5 Ed. 3.0 b:2023
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Semiconductor devices – Mechanical and climatic test methods – Part 5: Steady-state temperature humidity bias life test
International Electrotechnical Commission , 12/01/2023
Pages: 22
This part of IEC 60749 provides a steady-state temperature and humidity bias life test to evaluate the reliability of non-hermetic packaged semiconductor devices in humid environments.
This test method is considered destructive.
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